On the determination of crystalline silica in the presence of amorphous silica

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<rdf:Description>
<dc:creator>Bye, Erik</dc:creator>
<dc:date>1980</dc:date>
<dc:description xml:lang="es">Sumario: The infrared spectroscopic and X-ray diffraction techniques of analysing silica are compared. It is shown, contrary to the NIOSH manual, that amorphous silica interferes in the infrared analyses of crystalline silica. Accordingly, it is necessary to analyse mixtures of the two by means of X-ray diffraction in order to obtain crystalline silica contents</dc:description>
<dc:identifier>https://documentacion.fundacionmapfre.org/documentacion/publico/es/bib/45587.do</dc:identifier>
<dc:language>eng</dc:language>
<dc:rights xml:lang="es">InC - http://rightsstatements.org/vocab/InC/1.0/</dc:rights>
<dc:subject xml:lang="es">Higiene industrial</dc:subject>
<dc:subject xml:lang="es">Contaminantes químicos</dc:subject>
<dc:subject xml:lang="es">Sílice</dc:subject>
<dc:subject xml:lang="es">Espectroscopia</dc:subject>
<dc:subject xml:lang="es">Rayos X</dc:subject>
<dc:subject xml:lang="es">Métodos de análisis</dc:subject>
<dc:type xml:lang="es">Artículos y capítulos</dc:type>
<dc:title xml:lang="es">On the determination of crystalline silica in the presence of amorphous silica</dc:title>
<dc:title xml:lang="es">Título: The Annals of occupational hygiene</dc:title>
<dc:relation xml:lang="es">En: The Annals of occupational hygiene. - Oxford [etc.]. - nº 4, 1980 ; p. 329-334</dc:relation>
</rdf:Description>
</rdf:RDF>