Generation of ethylene oxide permissible exposure limit data with on-site sample analysis using the EO Self-ScanTM passive monitor
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100 | 1 | $0MAPA20080145033$aPuskar, Mark A. | |
245 | 1 | 0 | $aGeneration of ethylene oxide permissible exposure limit data with on-site sample analysis using the EO Self-ScanTM passive monitor$cMark A. Puskar, Julie L. Nowak, Lawrence H. Hecker |
520 | $aA sampling and analytical method is presented for the use of EO Self-ScanTM dosimeters for the determination of ethylene oxide permissible exposure limit (PEL) data. Analysis and report generation are performed on-site by trained personnel. A computer program for performing the calculaations required to obtain accurate exposure data is described | ||
650 | 1 | 1 | $0MAPA20080585679$aHigiene industrial |
650 | 1 | 1 | $0MAPA20080605278$aContaminantes químicos |
650 | 1 | 1 | $0MAPA20080576974$aOxido de etileno |
650 | 1 | 1 | $0MAPA20080613655$aControl de contaminantes |
650 | 1 | 1 | $0MAPA20080554033$aDosimetría |
650 | 1 | 1 | $0MAPA20080554040$aDosímetros |
650 | 1 | 1 | $0MAPA20080591960$aMétodos de análisis |
650 | 1 | 1 | $0MAPA20080560973$aValores TLV |
700 | 1 | $0MAPA20080142773$aNowak, Julie L. | |
700 | 1 | $0MAPA20080244958$aHecker, Lawrence H. | |
740 | 0 | $aAmerican Industrial Hygiene Association journal | |
773 | 0 | $tAmerican Industrial Hygiene Association journal$dAkron, Ohio$gVol. 51, nº 5, May 1990 ; p. 273-279 |