Centro de Documentacion de Fundación MAPFRE - The Limits of detection for the monitoring of semiconductor manufacturing gas and vapor emissions by Fourier transform infrared (FTIR) spectroscopy

Notas: Sumario: To determine whether or not the Fourier transform infrared (FTIR) spectrometer is appropriate for industrial hygiene monitoring of the gases and vapors used in the semiconductor industry, the limits of detection (LOD) of these compounds were determined. The LODs were calculated using several widely used definitions to test whether the values obtained by the different methods would vary significantly. The experimental LOD values for the study compounds all were below their respective threshold limit values (TLVs)Registros relacionados: En: American Industrial Hygiene Association journal. - Akron, Ohio. - Vol. 50, nº 2, February 1989 ; p. 78-84Materia / lugar / evento: Higiene industrial Contaminantes químicos Gases tóxicos Vapores Detectores de gases Espectrometría FTIR Valores TLV Espectroscopia Otros autores: Levine, Steven P.
Títulos secundários: Título: American Industrial Hygiene Association journal
Outras classificações: 872