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Comparative testing of a FTIR remote optical sensor with area samplers in a controlled ventilation chamber

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<rdf:Description>
<dc:creator>Yost, M.G.</dc:creator>
<dc:date>1992-10-01</dc:date>
<dc:description xml:lang="es">Sumario: A portable Fourier transform infrared remote opticalsensing spectrometer was deployed and tested in a constant ventilation test chamber by using a tracer gas source. Continuous beam path measurements were collected and compared to air samples obtained from a computer-controlled, multiple-point sampling array connected to a flame ionization detector. Measurements were gathered at two defferent room ventilation rates and at two different dispersion conditions</dc:description>
<dc:identifier>https://documentacion.fundacionmapfre.org/documentacion/publico/es/bib/47890.do</dc:identifier>
<dc:language>eng</dc:language>
<dc:rights xml:lang="es">InC - http://rightsstatements.org/vocab/InC/1.0/</dc:rights>
<dc:subject xml:lang="es">Higiene industrial</dc:subject>
<dc:subject xml:lang="es">Contaminantes químicos</dc:subject>
<dc:subject xml:lang="es">Contaminación atmosférica</dc:subject>
<dc:subject xml:lang="es">Ventilación</dc:subject>
<dc:subject xml:lang="es">Tests</dc:subject>
<dc:subject xml:lang="es">Rayos infrarrojos</dc:subject>
<dc:subject xml:lang="es">Espectroscopia</dc:subject>
<dc:subject xml:lang="es">FTIR</dc:subject>
<dc:subject xml:lang="es">Métodos de análisis</dc:subject>
<dc:subject xml:lang="es">Control de contaminantes</dc:subject>
<dc:subject xml:lang="es">Muestreos</dc:subject>
<dc:subject xml:lang="es">Detectores ópticos</dc:subject>
<dc:type xml:lang="es">Artículos y capítulos</dc:type>
<dc:title xml:lang="es">Comparative testing of a FTIR remote optical sensor with area samplers in a controlled ventilation chamber</dc:title>
<dc:title xml:lang="es">Título: American Industrial Hygiene Association journal</dc:title>
<dc:relation xml:lang="es">En: American Industrial Hygiene Association journal. - Akron, Ohio. - Vol. 53, nº 10, October 1992 ; p. 611-616</dc:relation>
</rdf:Description>
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