| LDR | | | 00000nam a22000004b 4500 |
| 001 | | | MAP20090098503 |
| 003 | | | MAP |
| 005 | | | 20091123091242.0 |
| 008 | | | 091118s1972 usa|||| ||| ||eng d |
| 040 | | | $aMAP$bspa |
| 084 | | | $a872 |
| 110 | 2 | | $0MAPA20090040168$aAnalytical techniques for quartz$d1972 |
| 245 | 1 | 0 | $aProceedings roundtable discussion on analytical techniques for quartz$b : december 6-7, 1972 |
| 260 | | | $aOhio$bACGIH$c1972 |
| 300 | | | $aVIII, 152 p.$c28 cm. |
| 500 | | | $aFondo donado por el Sr. Enrique González Fernández, del INSHT |
| 520 | | | $aX-ray diffraction -- Energy dispersive x-ray diffraction technique -- Infrared spectroscopy -- X-ray diffraction -- Infrared spectroscopy -- X-ray diffraction -- Exo-electron emission -- Differential thermal analysis -- X-ray diffraction -- Colorimetric analysis -- The NBS standard reference material program -- The NIOSH proficiency analytical testing program -- A field study of three North Carolina Mineral processing plants, free silica analysis |
| 650 | | 1 | $0MAPA20080545192$aRayos X |
| 650 | | 1 | $0MAPA20080540760$aCuarzo |
| 650 | | 1 | $0MAPA20080591960$aMétodos de análisis |
| 650 | | 1 | $0MAPA20080568825$aEspectrometría |
| 650 | | 1 | $0MAPA20080582203$aRayos infrarrojos |
| 856 | | | $yMÁS INFORMACIÓN
$umailto:centrodocumentacion@fundacionmapfre.org?subject=Consulta%20de%20una%20publicaci%C3%B3n%20&body=Necesito%20m%C3%A1s%20informaci%C3%B3n%20sobre%20este%20documento%3A%20%0A%0A%5Banote%20aqu%C3%AD%20el%20titulo%20completo%20del%20documento%20del%20que%20desea%20informaci%C3%B3n%20y%20nos%20pondremos%20en%20contacto%20con%20usted%5D%20%0A%0AGracias%20%0A |
