Proceedings roundtable discussion on analytical techniques for quartz : december 6-7, 1972

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<dc:creator>Analytical techniques for quartz (1972)</dc:creator>
<dc:date>1972</dc:date>
<dc:description xml:lang="es">Fondo donado por el Sr. Enrique González Fernández, del INSHT</dc:description>
<dc:description xml:lang="es">Sumario: X-ray diffraction -- Energy dispersive x-ray diffraction technique -- Infrared spectroscopy -- X-ray diffraction -- Infrared spectroscopy -- X-ray diffraction -- Exo-electron emission -- Differential thermal analysis -- X-ray diffraction -- Colorimetric analysis -- The NBS standard reference material program -- The NIOSH proficiency analytical testing program -- A field study of three North Carolina Mineral processing plants, free silica analysis</dc:description>
<dc:identifier>https://documentacion.fundacionmapfre.org/documentacion/publico/es/bib/116351.do</dc:identifier>
<dc:language>eng</dc:language>
<dc:publisher>ACGIH</dc:publisher>
<dc:rights xml:lang="es">InC - http://rightsstatements.org/vocab/InC/1.0/</dc:rights>
<dc:subject xml:lang="es">Rayos X</dc:subject>
<dc:subject xml:lang="es">Cuarzo</dc:subject>
<dc:subject xml:lang="es">Métodos de análisis</dc:subject>
<dc:subject xml:lang="es">Espectrometría</dc:subject>
<dc:subject xml:lang="es">Rayos infrarrojos</dc:subject>
<dc:type xml:lang="es">Libros</dc:type>
<dc:title xml:lang="es">Proceedings roundtable discussion on analytical techniques for quartz : december 6-7, 1972</dc:title>
<dc:format xml:lang="es">VIII, 152 p. ; 28 cm.</dc:format>
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