An Emotion-based model of risk perception and stigma susceptibility : cognitive appraisals of emotion, affective reactivity, worldviews, and risk perceptions in the generation of technology stigma

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<rdf:Description>
<dc:creator>Peters, Ellen M.</dc:creator>
<dc:creator>Burraston, Burt</dc:creator>
<dc:creator>Mertz, C.K.</dc:creator>
<dc:date>2004-10-01</dc:date>
<dc:description xml:lang="es">In the present article, the authors examine the interaction between two psychological systems - emotion and cognition - and their joint influence on perceptions and acceptability of radiation sources. They suggest which feelings and thoughts may matter most and use structural equation models to test hypotheses concerning how they likely combine</dc:description>
<dc:identifier>https://documentacion.fundacionmapfre.org/documentacion/publico/es/bib/58190.do</dc:identifier>
<dc:language>eng</dc:language>
<dc:rights xml:lang="es">InC - http://rightsstatements.org/vocab/InC/1.0/</dc:rights>
<dc:subject xml:lang="es">Percepción del riesgo</dc:subject>
<dc:subject xml:lang="es">Comunicación del riesgo</dc:subject>
<dc:subject xml:lang="es">Emociones</dc:subject>
<dc:subject xml:lang="es">Cognición</dc:subject>
<dc:subject xml:lang="es">Análisis de riesgos</dc:subject>
<dc:subject xml:lang="es">Radiación</dc:subject>
<dc:type xml:lang="es">Artículos y capítulos</dc:type>
<dc:title xml:lang="es">An Emotion-based model of risk perception and stigma susceptibility : cognitive appraisals of emotion, affective reactivity, worldviews, and risk perceptions  in the generation of technology stigma</dc:title>
<dc:title xml:lang="es">Título: Risk analysis : an international journal</dc:title>
<dc:relation xml:lang="es">En: Risk analysis : an international journal. - New York and London. - nº 5, October 2004 ; p. 1349-1367</dc:relation>
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