Centro de Documentacion de Fundación MAPFRE - On the determination of crystalline silica in the presence of amorphous silica

Notas: Sumario: The infrared spectroscopic and X-ray diffraction techniques of analysing silica are compared. It is shown, contrary to the NIOSH manual, that amorphous silica interferes in the infrared analyses of crystalline silica. Accordingly, it is necessary to analyse mixtures of the two by means of X-ray diffraction in order to obtain crystalline silica contentsRegistros relacionados: En: The Annals of occupational hygiene. - Oxford [etc.]. - nº 4, 1980 ; p. 329-334Materia / lugar / evento: Higiene industrial Contaminantes químicos Sílice Espectroscopia Rayos X Métodos de análisis Otros autores: Bye, Erik
Títulos secundários: Título: The Annals of occupational hygiene
Outras classificações: 872